-;EG-CHECK-LABEL: @test
-;EG-CHECK: EXP_IEEE *
-;CM-CHECK-LABEL: @test
-;CM-CHECK: EXP_IEEE T{{[0-9]+}}.X, -|T{{[0-9]+}}.X|
-;CM-CHECK: EXP_IEEE T{{[0-9]+}}.Y (MASKED), -|T{{[0-9]+}}.X|
-;CM-CHECK: EXP_IEEE T{{[0-9]+}}.Z (MASKED), -|T{{[0-9]+}}.X|
-;CM-CHECK: EXP_IEEE * T{{[0-9]+}}.W (MASKED), -|T{{[0-9]+}}.X|
+;EG-LABEL: {{^}}test:
+;EG: EXP_IEEE *
+;CM-LABEL: {{^}}test:
+;CM: EXP_IEEE T{{[0-9]+}}.X, -|T{{[0-9]+}}.X|
+;CM: EXP_IEEE T{{[0-9]+}}.Y (MASKED), -|T{{[0-9]+}}.X|
+;CM: EXP_IEEE T{{[0-9]+}}.Z (MASKED), -|T{{[0-9]+}}.X|
+;CM: EXP_IEEE * T{{[0-9]+}}.W (MASKED), -|T{{[0-9]+}}.X|