[mips][ias] Remove spurious ';' from inline assembly test.
authorDaniel Sanders <daniel.sanders@imgtec.com>
Mon, 16 Nov 2015 14:19:32 +0000 (14:19 +0000)
committerDaniel Sanders <daniel.sanders@imgtec.com>
Mon, 16 Nov 2015 14:19:32 +0000 (14:19 +0000)
commita3a518c309cd5469c6548de63a0bb140bc8291f2
treef12dff65c8735aa128c5162bf6cebaa8228a3a5a
parent5bc4edececc86bd0f1dcfb03481d3437d2553038
[mips][ias] Remove spurious ';' from inline assembly test.

IAS will not emit it. NFC at the moment but will prevent a test failure once
IAS is enabled.

git-svn-id: https://llvm.org/svn/llvm-project/llvm/trunk@253210 91177308-0d34-0410-b5e6-96231b3b80d8
test/CodeGen/Mips/inlineasmmemop.ll